Hwang, DG Kim, JK Kim, SW Lee, SS Koo, H Chung, SH Dreyer, M Gomez, RD 2024-01-21T09:05:19Z 2024-01-21T09:05:19Z 2021-09-01 2003-04-01 0304-8853 https://pubs.kist.re.kr/handle/201004/138658 The dependence on nickel oxide thickness in unidirectional and isotropic exchange-coupled NiO/NiFe bilayer films was investigated by magnetic force microscopy to better understand exchange biasing at microscopic length scales. As the NiO thickness increased, the domain structure of unidirectional biased films formed smaller and more complex inplane domains. By contrast, for the isotropically coupled films, large domains generally formed with increasing NiO thickness including a new cross type domain with out-of-plane magnetization orientation. The density of the cross domain is proportional to exchange biasing field, and the fact that the domain mainly originated from the strongest exchange coupled region was confirmed by imaging in an applied external field during a magnetization cycle. (C) 2002 Elsevier Science B.V. All rights reserved. English ELSEVIER MAGNETIZATION REVERSAL PROCESS CONFIGURATIONS ASYMMETRY Microscopic domain structures in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers Article 10.1016/S0304-8853(02)01379-3 1 JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.260, no.3, pp.400 - 405 JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 260 3 400 405 scie scopus 000181948700013 Materials Science, Multidisciplinary Physics, Condensed Matter Materials Science Physics Article MAGNETIZATION REVERSAL PROCESS CONFIGURATIONS ASYMMETRY exchange biasing cross-type domain nickel oxide MFM