Chang, JW Kim, H Kim, JK Ju, BK Jang, J Lee, YH 2024-01-21T09:14:44Z 2024-01-21T09:14:44Z 2022-01-11 2003-02 0374-4884 https://pubs.kist.re.kr/handle/201004/138831 In order to reach high quality of organic thin films such as high mobility for device applications, it is strongly desirable to study the growth properties of pentacene film as a function of evaporation conditions. Here, we report the structure and morphology of thermal evaporated pentacene thin film by Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and X-ray diffractometry (XRD) as a function of the evaporation rate and substrate temperature. These results play a key role in determining the electrical performance of organic thin film transistor devices. English KOREAN PHYSICAL SOC POLYMER Structure and morphology of vacuum-evaporated pentacene as a function of the substrate temperature Article 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.42, pp.S647 - S651 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 42 S647 S651 scie scopus kci 000181337500124 2-s2.0-0037305246 Physics, Multidisciplinary Physics Article; Proceedings Paper POLYMER vacuum-evaporated pentacene re-evaporation