Yoo, DC Lee, JY Sinclair, R Kim, IS Kim, YT 2024-01-21T09:32:12Z 2024-01-21T09:32:12Z 2021-09-01 2003-02 0374-4884 https://pubs.kist.re.kr/handle/201004/138883 Ferroelectric layered-perovskite SrBi2Nb2O9 (SBN) thin films have been deposited on Si (100) substrates by metalorganic decomposition method. The crystallization process of the SBN thin films post-annealed under various temperature conditions was investigated using transmission electron microscopy (TEM). The SBN thin films annealed up to 600 degreesC had a fluorite-like phase and had nano-sized round grains. High resolution TEM study revealed that the fluorite-like phase was cubic Bi2O3. However, the SBN thin film annealed at 700 degreesC had a layered-perovskite SBN phase with very large grains about 0.2 - 0.3 mum. It was found that these large grains originated from the agglomeration of the small round grains having similar orientations rather than from the growth of small grains. English KOREAN PHYSICAL SOC FERROELECTRIC CAPACITORS SRBI2TA2O9 FATIGUE GROWTH Characterization for crystallization of SrBi2Nb2O9 thin films on Si substrates Article 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.42, pp.S450 - S453 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 42 S450 S453 scie scopus kci ART001196557 000181337500084 2-s2.0-0037307597 Physics, Multidisciplinary Physics Article; Proceedings Paper FERROELECTRIC CAPACITORS SRBI2TA2O9 FATIGUE GROWTH high-resolution transmission electron microscopy layered structure crystallization