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<dcvalue element="contributor" qualifier="author">Kim,&#x20;HK</dcvalue>
<dcvalue element="contributor" qualifier="author">Seong,&#x20;TY</dcvalue>
<dcvalue element="contributor" qualifier="author">Lim,&#x20;JH</dcvalue>
<dcvalue element="contributor" qualifier="author">Ok,&#x20;YW</dcvalue>
<dcvalue element="contributor" qualifier="author">Cho,&#x20;WI</dcvalue>
<dcvalue element="contributor" qualifier="author">Shin,&#x20;YH</dcvalue>
<dcvalue element="contributor" qualifier="author">Yoon,&#x20;YS</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T10:08:43Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T10:08:43Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-01</dcvalue>
<dcvalue element="date" qualifier="issued">2002-09</dcvalue>
<dcvalue element="identifier" qualifier="issn">1071-1023</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;139266</dcvalue>
<dcvalue element="description" qualifier="abstract">We&#x20;have&#x20;fabricated&#x20;all&#x20;solid-state&#x20;thin-film&#x20;microsupercapacitors&#x20;(TFSCs)&#x20;using&#x20;RuO2&#x20;electrodes&#x20;and&#x20;UPON&#x20;electrolytes.&#x20;The&#x20;RuO2&#x20;electrodes&#x20;were&#x20;grown&#x20;at&#x20;oxygen&#x20;gas&#x20;flow&#x20;ratios&#x20;[O-2&#x2F;(O-2&#x20;+Ar)]&#x20;of&#x20;10%&#x20;and&#x20;30%.&#x20;Room-temperature&#x20;charge-discharge&#x20;measurements&#x20;show&#x20;that&#x20;specific&#x20;capacitance&#x20;is&#x20;dependent&#x20;on&#x20;the&#x20;oxygen&#x20;gas&#x20;flow&#x20;ratio.&#x20;Glancing&#x20;angle&#x20;x-ray&#x20;diffraction&#x20;(GXRD)&#x20;and&#x20;transmission&#x20;electron&#x20;microscopy&#x20;(TEM)&#x20;results&#x20;show&#x20;that&#x20;the&#x20;RuO2&#x20;electrodes&#x20;grown&#x20;at&#x20;10%&#x20;contain&#x20;nanocrystallites&#x20;(0.7-10&#x20;nm&#x20;across)&#x20;embedded&#x20;in&#x20;the&#x20;amorphous&#x20;matrix,&#x20;while&#x20;the&#x20;electrodes&#x20;grown&#x20;at&#x20;30%&#x20;are&#x20;polycrystalline&#x20;(with&#x20;grains&#x20;of&#x20;0.7-15&#x20;nm&#x20;in&#x20;diameter).&#x20;Based&#x20;on&#x20;the&#x20;GXRD,&#x20;TEM,&#x20;Auger&#x20;electron&#x20;spectroscopy&#x20;depth&#x20;profile,&#x20;and&#x20;scanning&#x20;electron&#x20;microscopy&#x20;results,&#x20;the&#x20;oxygen&#x20;flow&#x20;ratio&#x20;dependence&#x20;of&#x20;the&#x20;cycling&#x20;performance&#x20;of&#x20;the&#x20;RuO2-based&#x20;TFSCs&#x20;are&#x20;discussed&#x20;in&#x20;terms&#x20;of&#x20;the&#x20;combined&#x20;effects&#x20;of&#x20;the&#x20;microstructures&#x20;of&#x20;the&#x20;electrodes,&#x20;interfacial&#x20;products,&#x20;and&#x20;the&#x20;surface&#x20;morphology&#x20;of&#x20;the&#x20;electrodes.&#x20;(C)&#x20;2002&#x20;American&#x20;Vacuum&#x20;Society.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">A&#x20;V&#x20;S&#x20;AMER&#x20;INST&#x20;PHYSICS</dcvalue>
<dcvalue element="subject" qualifier="none">RUTHENIUM&#x20;OXIDE</dcvalue>
<dcvalue element="title" qualifier="none">Correlation&#x20;between&#x20;the&#x20;microstructures&#x20;and&#x20;the&#x20;cycling&#x20;performance&#x20;of&#x20;RuO2&#x20;electrodes&#x20;for&#x20;thin-film&#x20;microsupercapacitors</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1116&#x2F;1.1500752</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;VACUUM&#x20;SCIENCE&#x20;&amp;&#x20;TECHNOLOGY&#x20;B,&#x20;v.20,&#x20;no.5,&#x20;pp.1827&#x20;-&#x20;1832</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;VACUUM&#x20;SCIENCE&#x20;&amp;&#x20;TECHNOLOGY&#x20;B</dcvalue>
<dcvalue element="citation" qualifier="volume">20</dcvalue>
<dcvalue element="citation" qualifier="number">5</dcvalue>
<dcvalue element="citation" qualifier="startPage">1827</dcvalue>
<dcvalue element="citation" qualifier="endPage">1832</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000178669200005</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-0036026347</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Nanoscience&#x20;&amp;&#x20;Nanotechnology</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Science&#x20;&amp;&#x20;Technology&#x20;-&#x20;Other&#x20;Topics</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">RUTHENIUM&#x20;OXIDE</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">thin&#x20;film&#x20;supercapacitor</dcvalue>
</dublin_core>
