구대영 김원목 조상무 황민수 이인규 정병기 이택성 이경석 조성훈 2024-01-21T10:12:18Z 2024-01-21T10:12:18Z 2021-09-06 2002-08 1225-0562 https://pubs.kist.re.kr/handle/201004/139331 A study was made to examine the electrical, compositional, structural and morphological properties of Ag thin films deposited by DC magnetron sputtering in O2 atmosphere with deposition temperature from room temperature to 150℃ using in-line sputter system. The Ag films deposited at temperature above 100℃ in oxygen atmosphere gave a similar specific resistivity to and even lower oxygen content than those deposited using pure Ar sputter gas. The Ag films deposited with pure Ar gas was mainly composed of crystallites with [111] preferred orientation, while, for those deposited in oxygen atmosphere, more than 50% of the volume was composed of crystallites with [100] orientation. The difference in the micro structure did not cause any difference in the specific resistivity of Ag films. The results showed that the transparent conducting oxide films and the Ag films could be processed sequentially in the same deposition chamber with careful control of deposition temperature, which might result in a cost reduction for constructing the large scale in-line deposition system. 한국재료학회 In-line 마그네트론 스퍼터 장치를 사용하여 산소 분위기에서 제작한 Ag 박막의 특성 Properties of Ag Thin Films Deposited in Oxygen Atmosphere Using in-line Magnetron Sputter System Article 2 한국재료학회지, v.12, no.8, pp.661 - 668 한국재료학회지 12 8 661 668 kci ART000987471 Transparent conducting films Ag films Specific resistivity Oxygen In-line sputter