Hwang, HM Kim, IS You, DG Park, HS Sung, MC Jeong, K Lee, J Kim, TG Song, JH 2024-01-21T10:31:42Z 2024-01-21T10:31:42Z 2021-09-01 2002-07 0374-4884 https://pubs.kist.re.kr/handle/201004/139414 We present various hysteresis loops of epitaxial Ni/Cu(001) grown on HF-treated Si(001). Reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD) measurements show that the Cu and the subsequently deposited Ni films are epitaxial and have fee structures. Magneto-optic Kerr effect (MOKE) measurements from the step-wedged Ni films show the double transitions of a magnetic anisotropy (in-plane-->perpendicular-->in-plane). In polar MOKE measurements, at remanence, a 100 % of the magnetization is found for Ni thicknesses in the range of 20similar to75 Angstrom. The remanence measurement on the 200-Angstrom Ni film clearly showed fourfold magnetic in-plane anisotropy, which is a direct magnetic confirmation of a fcc epitaxial structure. English KOREAN PHYSICAL SOC CU/NI/CU/SI(001) FILMS MAGNETOELASTIC ANISOTROPY FERROMAGNETIC-RESONANCE ULTRATHIN FILMS FE(100) FILMS THIN-FILMS CO FE CU(100)/SI(100) TEMPERATURE MOKE studies of the magnetic anisotropy of epitaxial Ni/Cu(001) structure on HF-treated Si(001) Article 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.41, no.1, pp.114 - 117 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 41 1 114 117 scie scopus kci other ART000882111 000176841900022 2-s2.0-0036021641 Physics, Multidisciplinary Physics Article CU/NI/CU/SI(001) FILMS MAGNETOELASTIC ANISOTROPY FERROMAGNETIC-RESONANCE ULTRATHIN FILMS FE(100) FILMS THIN-FILMS CO FE CU(100)/SI(100) TEMPERATURE PMA