Moon, MW Chung, JW Lee, KR Oh, KH Wang, R Evans, AG 2024-01-21T11:01:53Z 2024-01-21T11:01:53Z 2021-09-05 2002-03-14 1359-6454 https://pubs.kist.re.kr/handle/201004/139690 The role of imperfections on the initiation and propagation of buckle driven delaminations in compressed thin films has been demonstrated using experiments performed with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The wavelengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection wavelength. The findings have been rationalized in terms of theoretical results for the effect of imperfections on the energy release rate. (C) 2002 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved. English PERGAMON-ELSEVIER SCIENCE LTD CARBON-FILMS STRESS DELAMINATION DECOHESION CRACKING PROPAGATION NUCLEATION ADHESION MODULUS FAILURE An experimental study of the influence of imperfections on the buckling of compressed thin films Article 10.1016/S1359-6454(01)00423-2 1 ACTA MATERIALIA, v.50, no.5, pp.1219 - 1227 ACTA MATERIALIA 50 5 1219 1227 scie scopus 000174732600026 2-s2.0-0037075750 Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering Materials Science Metallurgy & Metallurgical Engineering Article CARBON-FILMS STRESS DELAMINATION DECOHESION CRACKING PROPAGATION NUCLEATION ADHESION MODULUS FAILURE interface separation defect buckle driven delamination coating FIB