Lee, WY Bland, JAC 2024-01-21T11:43:14Z 2024-01-21T11:43:14Z 2021-09-05 2001-10 0374-4884 https://pubs.kist.re.kr/handle/201004/140163 The dynamic magnetization reversal behavior of polycrystalline Ni80Fe20 films (thickness 60 and 200 Angstrom) was studied in the temperature range 90 similar to 300 K by applying a magnetic field along the easy magnetization axis of the samples. The loop area A is found to follow the scaling relation A proportional to H(0)(alpha)Omega T-beta(-gamma) with alpha approximate to 0.9, beta approximate to 0.8, and gamma = 0.38 for both thicknesses, where H-0 is the magnetic field amplitude, Omega is frequency, and T is temperature, This behavior is only qualitatively consistent with theoretical models if the magnetization reversal mechanism is identical for both films, independently of the applied field and sample temperature. The exponents alpha and beta are found to be independent of the temperature, indicating that the dynamic reversal mechanism is unchanged in this temperature range. The hard-axis loop also evolves with increasing frequency, and the loop areas of the hard axis obey the scaling relation with beta (HA) = 0.47 +/- 0.02. English KOREAN PHYSICAL SOC CO FILMS SYSTEMS MODEL CU(001) FIELDS Magnetic hysteresis dynamics in Ni80Fe20 thin films Article 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, no.4, pp.661 - 666 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 39 4 661 666 scie scopus kci other 000171573500012 2-s2.0-0035541351 Physics, Multidisciplinary Physics Article CO FILMS SYSTEMS MODEL CU(001) FIELDS magnetization reversal dynamics