Kim, YK Lee, KS Baik, S 2024-01-21T12:01:46Z 2024-01-21T12:01:46Z 2021-09-01 2001-09 0884-2914 https://pubs.kist.re.kr/handle/201004/140233 Epitaxial (Pb1-xSrx)TiO3 (PST, x = 0.0-0.24) thin films were grown on MgO(001) single-crystal substrates by pulsed laser deposition. General x-ray diffraction techniques including theta -2 theta scan and rocking curve were used to determine lattice constants, degree of c-axis orientation, and crystal quality of the tetragonal thin films. The degree of c-axis orientation in the epitaxial PST films increased as Sr concentration (x) increased, which in turn induces the systematic change in the Curie temperature as well as the transformation strain at and below the Curie temperature. An inverse relation between the c-domain abundances and the transformation strains is established. English MATERIALS RESEARCH SOCIETY FERROELASTIC FILMS STRAIN RELAXATION PHASE-TRANSITION TITANATE Ferroelectric domain structure of epitaxial (Pb,Sr)TiO3 thin films Article 10.1557/JMR.2001.0336 1 JOURNAL OF MATERIALS RESEARCH, v.16, no.9, pp.2463 - 2466 JOURNAL OF MATERIALS RESEARCH 16 9 2463 2466 scie scopus 000170898900002 2-s2.0-0005081638 Materials Science, Multidisciplinary Materials Science Article FERROELASTIC FILMS STRAIN RELAXATION PHASE-TRANSITION TITANATE domain formation