박영준 2024-01-21T12:11:23Z 2024-01-21T12:11:23Z 2022-01-10 2001-06 1738-8228 https://pubs.kist.re.kr/handle/201004/140403 대한금속.재료학회 Electromigration-induced failure in near-bamboo interconnects Electromigration 에 의한 near-bamboo 배선의 파손 Article 2 대한금속 . 재료학회지 = Journal of the Korean Institute of Metals and Materials, v.39, no.6, pp.707 - 711 대한금속 . 재료학회지 = Journal of the Korean Institute of Metals and Materials 39 6 707 711 kci electromigration