전영민 김동환 조운조 이석 2024-01-21T12:39:35Z 2024-01-21T12:39:35Z 2022-01-10 2001-03 1226-4776 https://pubs.kist.re.kr/handle/201004/140645 Optical Society of Korea X-ray emission spectroscopic analysis for crystallized amorphous silicon induced by excimer laser annealing Article 2 Journal of the Optical Society of Korea, v.5, no.1, pp.1 - 4 Journal of the Optical Society of Korea 5 1 1 4 X-ray emission spectroscopy