Choi, HJ Kim, GH Lee, JG Kim, YW 2024-01-21T13:12:59Z 2024-01-21T13:12:59Z 2021-09-05 2000-11 0002-7820 https://pubs.kist.re.kr/handle/201004/140976 A refined continuum model has been proposed, based on the bond-strength consideration between cations and anions in the film, to address the effect of sintering additives on the behavior of intergranular glassy films (IGFs) in silicon nitride ceramics. The refined model indicates that the incorporation of additive ions in the film mill modify the attractive van der Waals and repulsive steric forces. The model also implies that the charge and size of the ions, which determine the bond strength between cations and anions, and the amount of ions are important parameters to the force balance and behavior of the IGFs, Experimental evidence for (i) the effect of sintering additives on the thickness of IGFs in Si3N4 ceramics and (ii) the occurrences of the "squeezing out" of IGFs in hot-pressed Si3N4 under a moderate external pressure (e.g., 25 MPa) are discussed, to confirm the validity of the present model. English AMER CERAMIC SOC TRANSMISSION ELECTRON-MICROSCOPY HIGH-TEMPERATURE STRENGTH MICROSTRUCTURE THICKNESS GLASSES PHASES CHEMISTRY STABILITY CREEP SI3N4 Refined continuum model on the behavior of intergranular films in silicon nitride ceramics Article 1 JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.83, no.11, pp.2821 - 2827 JOURNAL OF THE AMERICAN CERAMIC SOCIETY 83 11 2821 2827 scie scopus 000165235600030 2-s2.0-0034321906 Materials Science, Ceramics Materials Science Article TRANSMISSION ELECTRON-MICROSCOPY HIGH-TEMPERATURE STRENGTH MICROSTRUCTURE THICKNESS GLASSES PHASES CHEMISTRY STABILITY CREEP SI3N4 silicon nitride