Kim, KH Kim, YH Kim, J Han, SH Kim, HJ 2024-01-21T14:04:16Z 2024-01-21T14:04:16Z 2021-09-04 2000-06 0304-8853 https://pubs.kist.re.kr/handle/201004/141370 The magnetic properties of the films depend on the film thickness. To investigate the thickness effect, the films are prepared by a reactive rf magnetron sputtering method with different thicknesses (0.05-4.5 mu m). The angular dependency of resonance magnetic field and linewidth is observed by FMR technique at 9.84 GHz. As a result, there exist two different resonance modes in films below 1 mu m thickness. On the basis of the FMR, XRD and TEM, an amorphous phase forms during initial growth stage and it gradually changes to crystalline structure as the film thickness increases, (C) 2000 Elsevier Science B.V. All rights reserved. English ELSEVIER SCIENCE BV Thickness effect on magnetic properties in nanocrystalline Fe-Hf-N thin films Article 10.1016/S0304-8853(00)00179-7 1 JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.215, pp.428 - 430 JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 215 428 430 scie scopus 000087873100124 2-s2.0-0033727316 Materials Science, Multidisciplinary Physics, Condensed Matter Materials Science Physics Article; Proceedings Paper ferromagnetic resonance permeability nanocrystalline