Lee, GJ Kim, SH Jo, JC Lim, TK Yoon, JS Kwon, SB 2024-01-21T14:42:42Z 2024-01-21T14:42:42Z 2022-01-10 1999-12 0021-4922 https://pubs.kist.re.kr/handle/201004/141795 Two reflective-mode, pi/4-twisted-nematic liquid crystal cells were prepared using E7 and ZLI4801-000 liquid crystals and their electrooptic responses were measured in the voltage regions close to and distant from the Freedericksz transition threshold. Our reflectivity data distant from the threshold voltage (V-th) could not be described by the model that assumed a linearized distribution of the twist angle across the cell and considered the voltage dependency of the tilt angle to follow the equation suggested by Lu and Saleh [Appl. Opt. 30 (1991) 2354], although the fit is good near V-th. We determined that the reflectivity in the voltage region distant from V-th Should be calculated using the model that considers the distributions of the tilt angle and the twist angle. The director-axis distributions were obtained from the numerical integration of the Ericksen-Leslie equation. English JAPAN J APPLIED PHYSICS OPTICAL-PROPERTIES Electrooptic response of reflective-mode, pi/4-twisted-nematic liquid crystal cell in the voltage regions close to and distant from the Freedericksz transition threshold Article 10.1143/JJAP.38.6739 1 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.38, no.12A, pp.6739 - 6742 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 38 12A 6739 6742 scie scopus 000084519700033 2-s2.0-0033310531 Physics, Applied Physics Article OPTICAL-PROPERTIES Ericksen-Leslie equation director-axis deformation reflective liquid crystal cell electrooptical property Solc filter