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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Lee,&#x20;DJ</dcvalue>
<dcvalue element="contributor" qualifier="author">Ju,&#x20;BK</dcvalue>
<dcvalue element="contributor" qualifier="author">Jang,&#x20;J</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;KB</dcvalue>
<dcvalue element="contributor" qualifier="author">Oh,&#x20;MH</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T14:43:23Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T14:43:23Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-05</dcvalue>
<dcvalue element="date" qualifier="issued">1999-12</dcvalue>
<dcvalue element="identifier" qualifier="issn">0960-1317</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;141807</dcvalue>
<dcvalue element="description" qualifier="abstract">This&#x20;paper&#x20;presents&#x20;a&#x20;study&#x20;of&#x20;the&#x20;anodic&#x20;bonding&#x20;technique&#x20;using&#x20;a&#x20;hydrophilic&#x20;surface.&#x20;Our&#x20;method&#x20;differs&#x20;from&#x20;conventional&#x20;processes&#x20;in&#x20;the&#x20;pre-treatment&#x20;of&#x20;the&#x20;wafer.&#x20;Hydrophilic&#x20;surfaces&#x20;were&#x20;achieved&#x20;from&#x20;dipping&#x20;in&#x20;H2O&#x2F;H2O2&#x2F;NH4OH&#x20;solution.&#x20;The&#x20;hydrophilic&#x20;surface&#x20;has&#x20;a&#x20;large&#x20;number&#x20;of&#x20;-OH&#x20;groups,&#x20;which&#x20;can&#x20;form&#x20;hydrogen&#x20;bonds&#x20;when&#x20;two&#x20;wafers&#x20;are&#x20;in&#x20;contact.&#x20;This&#x20;induces&#x20;a&#x20;higher&#x20;electrostatic&#x20;force,&#x20;because&#x20;of&#x20;the&#x20;decreasing&#x20;gap&#x20;between&#x20;the&#x20;glass&#x20;and&#x20;silicon&#x20;wafer.&#x20;We&#x20;achieved&#x20;improved&#x20;properties,&#x20;such&#x20;as&#x20;a&#x20;wider&#x20;bonded&#x20;area&#x20;and&#x20;a&#x20;higher&#x20;bond&#x20;strength&#x20;than&#x20;those&#x20;of&#x20;conventional&#x20;methods.&#x20;Also,&#x20;the&#x20;fabricated&#x20;pressure&#x20;sensors&#x20;on&#x20;the&#x20;5-inch&#x20;silicon&#x20;wafer&#x20;were&#x20;bonded&#x20;to&#x20;Pyrex&#x20;#7740&#x20;glass&#x20;of&#x20;3&#x20;mm&#x20;thickness.&#x20;In&#x20;order&#x20;to&#x20;investigate&#x20;the&#x20;migration&#x20;of&#x20;the&#x20;sodium&#x20;ions,&#x20;the&#x20;depth&#x20;profile&#x20;at&#x20;the&#x20;glass&#x20;surface&#x20;by&#x20;secondary-ion&#x20;mass&#x20;spectroscopy&#x20;and&#x20;the&#x20;bonding&#x20;current&#x20;were&#x20;compared&#x20;with&#x20;that&#x20;of&#x20;conventional&#x20;methods.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">IOP&#x20;PUBLISHING&#x20;LTD</dcvalue>
<dcvalue element="subject" qualifier="none">SILICON</dcvalue>
<dcvalue element="title" qualifier="none">Effects&#x20;of&#x20;a&#x20;hydrophilic&#x20;surface&#x20;in&#x20;anodic&#x20;bonding</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1088&#x2F;0960-1317&#x2F;9&#x2F;4&#x2F;305</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;MICROMECHANICS&#x20;AND&#x20;MICROENGINEERING,&#x20;v.9,&#x20;no.4,&#x20;pp.313&#x20;-&#x20;318</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;MICROMECHANICS&#x20;AND&#x20;MICROENGINEERING</dcvalue>
<dcvalue element="citation" qualifier="volume">9</dcvalue>
<dcvalue element="citation" qualifier="number">4</dcvalue>
<dcvalue element="citation" qualifier="startPage">313</dcvalue>
<dcvalue element="citation" qualifier="endPage">318</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000084491500005</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-0033345095</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Nanoscience&#x20;&amp;&#x20;Nanotechnology</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Instruments&#x20;&amp;&#x20;Instrumentation</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Science&#x20;&amp;&#x20;Technology&#x20;-&#x20;Other&#x20;Topics</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Instruments&#x20;&amp;&#x20;Instrumentation</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SILICON</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">MEMS</dcvalue>
</dublin_core>
