Lee, KS Baik, S 2024-01-21T15:45:42Z 2024-01-21T15:45:42Z 2021-09-01 1999-02-01 0021-8979 https://pubs.kist.re.kr/handle/201004/142400 Phase transformation in epitaxial PbTiO3 thin films grown on MgO(001) substrates was studied and quantified by two-dimensional reciprocal space mapping technique using synchrotron x-ray diffraction equipped with an in situ high temperature stage. Just below the Curie temperature, a twin-like domain structure was formed with an initial value of c-domain abundance, alpha similar to 0.3, and the value increased continuously during cooling, and eventually the c-domain dominant structure (alpha similar to 0.72) was achieved at room temperature through continuous expansion of the c domains. By investigating the intensity distribution of contour maps, domain tilting and mosaicity were characterized along the q([h00]) direction and the presence of a strain gradient along the growth direction q([001]) was also confirmed from the asymmetric distribution of the contour maps. (C) 1999 American Institute of Physics. [S0021-8979(99)03403-9]. English AMER INST PHYSICS CHEMICAL-VAPOR-DEPOSITION RELAXATION EVOLUTION STRAIN Reciprocal space mapping of phase transformation in epitaxial PbTiO3 thin films using synchrotron x-ray diffraction Article 10.1063/1.369195 1 JOURNAL OF APPLIED PHYSICS, v.85, no.3, pp.1995 - 1997 JOURNAL OF APPLIED PHYSICS 85 3 1995 1997 scie scopus 000078137100112 Physics, Applied Physics Article CHEMICAL-VAPOR-DEPOSITION RELAXATION EVOLUTION STRAIN domain structure structure PZT epitaxy reciprocal space mapping phase transformation