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<dcvalue element="contributor" qualifier="author">Lee,&#x20;JI</dcvalue>
<dcvalue element="contributor" qualifier="author">Brini,&#x20;J</dcvalue>
<dcvalue element="contributor" qualifier="author">Dimitriadis,&#x20;CA</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T17:02:24Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T17:02:24Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-01</dcvalue>
<dcvalue element="date" qualifier="issued">1998-06-11</dcvalue>
<dcvalue element="identifier" qualifier="issn">0013-5194</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;143002</dcvalue>
<dcvalue element="description" qualifier="abstract">Simple.&#x20;on-site&#x20;parameter&#x20;extraction&#x20;methods&#x20;are&#x20;proposed;&#x20;the&#x20;ideality&#x20;factor,&#x20;series&#x20;resistance,&#x20;leakage&#x20;resistance&#x20;and&#x20;saturation&#x20;current&#x20;are&#x20;determined&#x20;from&#x20;the&#x20;current-voltage&#x20;characteristics&#x20;of&#x20;a&#x20;Shottky&#x20;barrier&#x20;diode.</dcvalue>
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<dcvalue element="publisher" qualifier="none">IEE-INST&#x20;ELEC&#x20;ENG</dcvalue>
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<dcvalue element="title" qualifier="none">Simple&#x20;parameter&#x20;extraction&#x20;method&#x20;for&#x20;non-ideal&#x20;Schottky&#x20;barrier&#x20;diodes</dcvalue>
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<dcvalue element="identifier" qualifier="bibliographicCitation">ELECTRONICS&#x20;LETTERS,&#x20;v.34,&#x20;no.12,&#x20;pp.1268&#x20;-&#x20;1269</dcvalue>
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<dcvalue element="citation" qualifier="volume">34</dcvalue>
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<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CONTACTS</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Schottky&#x20;barrier&#x20;diode</dcvalue>
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