Jang, PW Kim, DW Park, CH Na, JG Lee, SR 2024-01-21T17:02:59Z 2024-01-21T17:02:59Z 2021-09-03 1998-06-01 0021-8979 https://pubs.kist.re.kr/handle/201004/143012 (Co1-xFex)Pt films were grown on a glass substrate by a rf sputtering and then annealed at 650-700 degrees C in a high vacuum. All the as-sputtered (Co1-xFex)Pt films deposited below 400 degrees C had a disordered structure and showed very low coercivities. With increasing the deposition temperature and Fe contents, the (111) texture was weakened in as-deposited (Co1-xFex)Pt ternary filIns. Vibrating sample magnetometer and x-ray diffraction data show that Co atoms in the L1(o) CoPt phase were substituted with Fe atoms. In-plane coercivities of these films decreased almost linearly with increasing Fe content which seemed to be due to the decrease of a crystalline anisotropy energy. (C) 1998 American Institute of Physics. English AMER INST PHYSICS Magnetic and structural properties of (Co1-xFex)Pt thin films Article 10.1063/1.367671 1 JOURNAL OF APPLIED PHYSICS, v.83, no.11, pp.6614 - 6616 JOURNAL OF APPLIED PHYSICS 83 11 6614 6616 scie scopus 000077795500130 2-s2.0-0000821645 Physics, Applied Physics Article; Proceedings Paper CoFePt thin film Da Magnetic anisotropy. L10 structure