Kim, GH Lee, JI Lee, JC Lee, HI 2024-01-21T18:02:09Z 2024-01-21T18:02:09Z 2021-09-05 1997-10-01 1359-6462 https://pubs.kist.re.kr/handle/201004/143552 English PERGAMON-ELSEVIER SCIENCE LTD SILICON Measurements of Al concentration in the primary Si crystals from the rheocast Al-15.5 wt% Si alloy Article 10.1016/S1359-6462(97)00189-9 1 SCRIPTA MATERIALIA, v.37, no.7, pp.929 - 936 SCRIPTA MATERIALIA 37 7 929 936 scie scopus A1997XW41400005 2-s2.0-0031257325 Nanoscience & Nanotechnology Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering Science & Technology - Other Topics Materials Science Metallurgy & Metallurgical Engineering Article SILICON Rheocast lattice parameter convergent beam electron diffraction lattice strain Al-15.5 wt% Si alloy