이연희 한승희 2024-01-21T18:03:32Z 2024-01-21T18:03:32Z 2022-01-10 1997-10 https://pubs.kist.re.kr/handle/201004/143576 Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS) TOF-SIMS를 이용한 표면분석 Article 3 Analytical science and technology, v.10, no.5, pp.87A - 104A Analytical science and technology 10 5 87A 104A TOF-SIMS Surface analysis Polymer Depth profile Imaging