백영준 전승준 Arun Kumar Chawla 성창묘 2024-01-21T18:05:14Z 2024-01-21T18:05:14Z 2022-01-10 1997-09 https://pubs.kist.re.kr/handle/201004/143603 Three-dimensional TEM characterization of highly oriented diamond films on a (100) silicon substrate Article 3 The Korean journal of ceramics, v.3, no.3, pp.155 - 158 The Korean journal of ceramics 3 3 155 158 highly oriented diamond film