Kim, BK Hahn, JW Han, KR 2024-01-21T18:32:55Z 2024-01-21T18:32:55Z 2022-01-10 1997-04-15 0261-8028 https://pubs.kist.re.kr/handle/201004/143840 English CHAPMAN HALL LTD X-RAY-DIFFRACTION Quantitative phase analysis in tetragonal-rich tetragonal/monoclinic two phase zirconia by Raman spectroscopy Article 10.1023/A:1018587821260 1 JOURNAL OF MATERIALS SCIENCE LETTERS, v.16, no.8, pp.669 - 671 JOURNAL OF MATERIALS SCIENCE LETTERS 16 8 669 671 scie scopus A1997WX59400024 2-s2.0-0031123412 Materials Science, Multidisciplinary Materials Science Article X-RAY-DIFFRACTION phase analysis tetragonal zirconia Raman spectroscopy Y-TZP