Lee, HN Kim, YT Choh, SH 2024-01-21T18:41:37Z 2024-01-21T18:41:37Z 2022-01-11 1997-01 0015-0193 https://pubs.kist.re.kr/handle/201004/143990 The effect of RuOx and Pt electrodes on the crystal structure, leakage current characteristics and dielectric properties of PbTiO3 are compared with as-deposited and annealed samples. As a result, amorphous or microcrystalline PbTiO3 films on RuOx and Pt are recrystallized along the [100] direction after annealing at 600 degrees C for 30min in O-2 ambient. The leakage current density for both samples are very similar, whereas the dielectric property of RuOx/PbTiO3 is superior to that of Pt/PbTiO3 due to the large grain growth of PbTiO3 on RuOx confirmed with cross-sectional transmission electron microscopy. English GORDON BREACH SCI PUBL LTD Effects of bottom electrode on the structural and electrical properties of PbTiO3 ferroelectric thin films Article 1 FERROELECTRICS, v.197, no.1-4, pp.733 - 739 FERROELECTRICS 197 1-4 733 739 scie scopus A1997XX63600023 2-s2.0-0031353187 Materials Science, Multidisciplinary Physics, Condensed Matter Materials Science Physics Article; Proceedings Paper