Kang, YM Lee, KS Baik, SG 2024-01-21T19:07:05Z 2024-01-21T19:07:05Z 2021-09-01 1997-01 1058-4587 https://pubs.kist.re.kr/handle/201004/144191 Surface morphologies and microstructures of epitaxial (Pb1-xLax)TiO3 (PLT, x = 0.00, 0.08, 0.16, and 0.24) thin films grown on (100) MgO, have been investigated using various analytical techniques. Surface roughness of PLT films were measured by AFM and their domain structures were investigated by TEM and XRD. The surface roughness of the films varied severely with La concentration. For 0.08La-PLT film, very smooth surface has been achieved with 9.3 Angstrom of RMS roughness. Optical propagation losses of PLT films measured by prism coupling technique were 22.3, 6.0, 11.4, and 20.7 dB/cm for x = 0.00, 0.08, 0.16, and 0.24, respectively. Such a variation in optical losses seemed to be due to the surface morphology and abundance of domain boundaries that change continuous as a function of La concentration in the epitaxial PLT thin films. English GORDON BREACH SCI PUBL LTD PULSED-LASER DEPOSITION GROWTH Microstructure and optical loss in epitaxial (Pb,La)TiO3 thin films on (100) MgO Article 10.1080/10584589708013013 1 INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.387 - 394 INTEGRATED FERROELECTRICS 17 1-4 387 394 scie scopus A1997YF22200039 Engineering, Electrical & Electronic Physics, Applied Physics, Condensed Matter Engineering Physics Article; Proceedings Paper PULSED-LASER DEPOSITION GROWTH ferroelectric thin film PLT optical loss