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<dcvalue element="contributor" qualifier="author">Kim,&#x20;JH</dcvalue>
<dcvalue element="contributor" qualifier="author">Wang,&#x20;L</dcvalue>
<dcvalue element="contributor" qualifier="author">Zurn,&#x20;SM</dcvalue>
<dcvalue element="contributor" qualifier="author">Li,&#x20;L</dcvalue>
<dcvalue element="contributor" qualifier="author">Yoon,&#x20;YS</dcvalue>
<dcvalue element="contributor" qualifier="author">Polla,&#x20;DL</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T19:07:15Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T19:07:15Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-01</dcvalue>
<dcvalue element="date" qualifier="issued">1997-01</dcvalue>
<dcvalue element="identifier" qualifier="issn">1058-4587</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;144194</dcvalue>
<dcvalue element="description" qualifier="abstract">This&#x20;paper&#x20;discusses&#x20;the&#x20;fabrication&#x20;process&#x20;and&#x20;challenges&#x20;for&#x20;fabrication&#x20;of&#x20;piezoelectric&#x20;cantilever&#x20;beam&#x20;microaccelerometers&#x20;by&#x20;using&#x20;surface&#x20;micromachining&#x20;techniques.&#x20;PZT&#x20;thin&#x20;films&#x20;were&#x20;used&#x20;as&#x20;the&#x20;piezoelectric&#x20;material&#x20;to&#x20;detect&#x20;the&#x20;acceleration&#x20;of&#x20;the&#x20;cantilever&#x20;beam.&#x20;In&#x20;this&#x20;paper,&#x20;we&#x20;discuss&#x20;in&#x20;detail&#x20;the&#x20;process&#x20;challenges&#x20;encountered&#x20;in&#x20;piezoelectric&#x20;microaccelerometers.&#x20;These&#x20;major&#x20;challenges&#x20;include&#x20;PZT&#x20;thin&#x20;film&#x20;deposition&#x20;and&#x20;encapsulation&#x20;during&#x20;final&#x20;micromachining&#x20;membrane&#x20;release.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">GORDON&#x20;BREACH&#x20;SCI&#x20;PUBL&#x20;LTD</dcvalue>
<dcvalue element="title" qualifier="none">Fabrication&#x20;process&#x20;of&#x20;PZT&#x20;piezoelectric&#x20;cantilever&#x20;unimorphs&#x20;using&#x20;surface&#x20;micromachining</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1080&#x2F;10584589708015723</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">INTEGRATED&#x20;FERROELECTRICS,&#x20;v.15,&#x20;no.1-4,&#x20;pp.325&#x20;-&#x20;332</dcvalue>
<dcvalue element="citation" qualifier="title">INTEGRATED&#x20;FERROELECTRICS</dcvalue>
<dcvalue element="citation" qualifier="volume">15</dcvalue>
<dcvalue element="citation" qualifier="number">1-4</dcvalue>
<dcvalue element="citation" qualifier="startPage">325</dcvalue>
<dcvalue element="citation" qualifier="endPage">332</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">A1997WR71500034</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Condensed&#x20;Matter</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
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