Kang, WN Kim, YH Kim, CH Jang, JW Kim, IT Choi, SS Hahn, TS 2024-01-21T19:09:56Z 2024-01-21T19:09:56Z 2021-09-05 1996-11-01 0261-8028 https://pubs.kist.re.kr/handle/201004/144240 English CHAPMAN HALL LTD MICROSTRUCTURE LAALO3 MOCVD Thickness dependence of crystalline orientation in YBa2Cu3Ox thin films grown by metalorganic chemical vapour deposition Article 1 JOURNAL OF MATERIALS SCIENCE LETTERS, v.15, no.21, pp.1898 - 1901 JOURNAL OF MATERIALS SCIENCE LETTERS 15 21 1898 1901 scie scopus A1996VR27300022 2-s2.0-0030285257 Materials Science, Multidisciplinary Materials Science Article MICROSTRUCTURE LAALO3 MOCVD