이연희 한승희 이정혜 윤정현 2024-01-21T20:07:14Z 2024-01-21T20:07:14Z 2022-01-10 1996-01 https://pubs.kist.re.kr/handle/201004/144749 Characterization of plasma ion implanted surfaces using time-of-flight secondary ion mass spectrometry. Article 3 Journal of Korean institute of surface engineering, v.v. 29, no.no. 6, pp.? - ? Journal of Korean institute of surface engineering v. 29 no. 6 ? ?