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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">KOH,&#x20;SK</dcvalue>
<dcvalue element="contributor" qualifier="author">JIN,&#x20;ZG</dcvalue>
<dcvalue element="contributor" qualifier="author">LEE,&#x20;JY</dcvalue>
<dcvalue element="contributor" qualifier="author">JUNG,&#x20;HJ</dcvalue>
<dcvalue element="contributor" qualifier="author">KIM,&#x20;KH</dcvalue>
<dcvalue element="contributor" qualifier="author">CHOI,&#x20;DJ</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T20:38:54Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T20:38:54Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-02</dcvalue>
<dcvalue element="date" qualifier="issued">1995-07</dcvalue>
<dcvalue element="identifier" qualifier="issn">0734-2101</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;145052</dcvalue>
<dcvalue element="description" qualifier="abstract">Cu&#x20;films&#x20;were&#x20;deposited&#x20;on&#x20;Si(100)&#x20;substrate&#x20;by&#x20;partially&#x20;ionized&#x20;beam&#x20;in&#x20;a&#x20;pressure&#x20;of&#x20;10(-6)&#x20;Torr.&#x20;Ion&#x20;beam&#x20;current&#x20;densities&#x20;were&#x20;measured&#x20;with&#x20;and&#x20;without&#x20;Cu&#x20;evaporation,&#x20;respectively,&#x20;in&#x20;order&#x20;to&#x20;evaluate&#x20;an&#x20;effect&#x20;of&#x20;residual&#x20;gas&#x20;on&#x20;the&#x20;Cu&#x20;deposition&#x20;process.&#x20;The&#x20;ion&#x20;beam&#x20;current&#x20;density&#x20;measured&#x20;without&#x20;Cu&#x20;evaporation,&#x20;which&#x20;is&#x20;mainly&#x20;due&#x20;to&#x20;ionized&#x20;residual&#x20;gas,&#x20;was&#x20;linearly&#x20;increased&#x20;with&#x20;acceleration&#x20;voltage,&#x20;and&#x20;the&#x20;dependence&#x20;of&#x20;the&#x20;ion&#x20;beam&#x20;current&#x20;density&#x20;on&#x20;vacuum&#x20;pressure&#x20;was&#x20;significantly&#x20;decreased&#x20;with&#x20;10(-5)-10(-7)&#x20;Torr.&#x20;Total&#x20;ion&#x20;beam&#x20;current&#x20;density&#x20;measured&#x20;during&#x20;Cu&#x20;deposition,&#x20;effects&#x20;of&#x20;ionized&#x20;Cu&#x20;particles&#x20;and&#x20;residual&#x20;gas,&#x20;was&#x20;increased&#x20;with&#x20;acceleration&#x20;voltage,&#x20;and&#x20;the&#x20;magnitude&#x20;of&#x20;the&#x20;total&#x20;ion&#x20;beam&#x20;current&#x20;density&#x20;is&#x20;nearly&#x20;the&#x20;same&#x20;as&#x20;the&#x20;ion&#x20;beam&#x20;current&#x20;density&#x20;due&#x20;to&#x20;ionized&#x20;residual&#x20;gas.&#x20;Growth&#x20;rate&#x20;and&#x20;preferred&#x20;orientation&#x20;were&#x20;increased&#x20;with&#x20;acceleration&#x20;voltage,&#x20;and&#x20;grain&#x20;size&#x20;of&#x20;the&#x20;deposited&#x20;films&#x20;was&#x20;in&#x20;a&#x20;range&#x20;of&#x20;1000&#x20;Angstrom,&#x20;which&#x20;was&#x20;not&#x20;dependent&#x20;on&#x20;acceleration&#x20;voltage.&#x20;Root-mean-square&#x20;roughness&#x20;of&#x20;deposited&#x20;films&#x20;was&#x20;reduced&#x20;from&#x20;138&#x20;to&#x20;18&#x20;Angstrom&#x20;with&#x20;a&#x20;change&#x20;in&#x20;acceleration&#x20;voltage&#x20;from&#x20;0&#x20;to&#x20;3&#x20;kV.&#x20;These&#x20;changes&#x20;of&#x20;the&#x20;film&amp;apos;s&#x20;features&#x20;could&#x20;be&#x20;attributed&#x20;to&#x20;the&#x20;bombardment&#x20;effect&#x20;of&#x20;ionized&#x20;residual&#x20;gas.&#x20;(C)&#x20;1995&#x20;American&#x20;Vacuum&#x20;Society.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">A&#x20;V&#x20;S&#x20;AMER&#x20;INST&#x20;PHYSICS</dcvalue>
<dcvalue element="subject" qualifier="none">THIN&#x20;SILVER&#x20;FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">ION-BOMBARDMENT</dcvalue>
<dcvalue element="subject" qualifier="none">ELECTRICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="none">GROWTH</dcvalue>
<dcvalue element="subject" qualifier="none">MICROSTRUCTURE</dcvalue>
<dcvalue element="title" qualifier="none">EFFECT&#x20;OF&#x20;RESIDUAL-GAS&#x20;ON&#x20;CU&#x20;FILM&#x20;DEPOSITION&#x20;BY&#x20;PARTIALLY-IONIZED&#x20;BEAM</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1116&#x2F;1.579529</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;VACUUM&#x20;SCIENCE&#x20;&amp;&#x20;TECHNOLOGY&#x20;A,&#x20;v.13,&#x20;no.4,&#x20;pp.2123&#x20;-&#x20;2127</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;VACUUM&#x20;SCIENCE&#x20;&amp;&#x20;TECHNOLOGY&#x20;A</dcvalue>
<dcvalue element="citation" qualifier="volume">13</dcvalue>
<dcvalue element="citation" qualifier="number">4</dcvalue>
<dcvalue element="citation" qualifier="startPage">2123</dcvalue>
<dcvalue element="citation" qualifier="endPage">2127</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">A1995RK46100046</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-84955024365</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Coatings&#x20;&amp;&#x20;Films</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">THIN&#x20;SILVER&#x20;FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ION-BOMBARDMENT</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELECTRICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">GROWTH</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">MICROSTRUCTURE</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">copper&#x20;film</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">residual&#x20;gas</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">deposition</dcvalue>
</dublin_core>
