Hariz, A. Kim, H.G. Haskard, M.R. Chung, I.J. 2024-01-21T21:14:01Z 2024-01-21T21:14:01Z 2021-09-02 1995-01 0960-1317 https://pubs.kist.re.kr/handle/201004/145415 Vacuum microelectronics is an emerging and rapidly evolving technology. Characterized by field emission in vacuum microchambers, it has found applications in the display field, and more recently in sensor technology. In this paper we seek to report on a novel multidimensional method of utilizing field emission in acceleration sensors. Emission currents are directly related to, among other parameters, the distance separating the emission cathode and anode. When either or both electrodes are micromachined in a cantilever beam capable of deflection under the influence of an external force, the emission current detected will be a direct measure of force magnitude. Furthermore, we propose a design that will allow measurements of force components in three-dimensions. We present details of fabrication methods and theoretical concepts describing the mechanism proposed. ？ 1995 IOP Publishing Ltd. English Acceleration sensors Field emitter cathode Fowler-Nordheim tunnelling equation Vacuum microchambers Vacuum microelectronics Acceleration Electric breakdown Electric currents Electric fields Electron tunneling Fabrication Microelectronics Sensors Three dimensional Vacuum Cathodes Field-emitter cathode for acceleration sensors Article 10.1088/0960-1317/5/4/004 1 Journal of Micromechanics and Microengineering, v.5, no.4, pp.282 - 288 Journal of Micromechanics and Microengineering 5 4 282 288 scopus 2-s2.0-0029517988 Article Acceleration sensors Field emitter cathode Fowler-Nordheim tunnelling equation Vacuum microchambers Vacuum microelectronics Acceleration Electric breakdown Electric currents Electric fields Electron tunneling Fabrication Microelectronics Sensors Three dimensional Vacuum Cathodes