LEE, YH SHIN, YD HERR, PH LEE, KH KIM, HJ HAN, SH KANG, IK RHEE, JR 2024-01-21T21:31:09Z 2024-01-21T21:31:09Z 2021-09-02 1994-11 0018-9464 https://pubs.kist.re.kr/handle/201004/145475 This paper reports on a method for measuring magnetostriction, Young's modulus of a substrate or film, and Delta E with one apparatus. A substrate with thin magnetic film deposited on it is in parallel with and cantilevered above a metal plate electrode, and they form a capacitive cell. The cantilever deflects due to own weight, applied electric and magnetic fields, The small change of capacitance caused by this deflection is measured by a sensitive capacitance bridge. Young's modulus, magnetostriction, and Delta E effect can be calculated by a theoretical analysis with the measured deflection data. English IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC DC BIASED CAPACITANCE METHOD FOR MEASURING THIN-FILM MAGNETOSTRICTION AND DELTA-EPSILON-EFFECT Article 10.1109/20.334150 1 IEEE TRANSACTIONS ON MAGNETICS, v.30, no.6, pp.4566 - 4568 IEEE TRANSACTIONS ON MAGNETICS 30 6 4566 4568 N scie scopus A1994PU42900248 2-s2.0-0028548868 Engineering, Electrical & Electronic Physics, Applied Engineering Physics Article; Proceedings Paper thin film