박성우 Dong-Hwan Kim 김영만 박병선 한완수 서배석 2024-01-21T22:04:20Z 2024-01-21T22:04:20Z 2022-01-10 1994-01 https://pubs.kist.re.kr/handle/201004/145801 Surface analysis of modified polymer samples by x-ray photoelectron spectroscopy and rutherford backscattering spectroscopy. X- 선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석 = Article 3 분석과학회지 = Journal of the Korean Society of Analytical Sciences, v.v. 7, no.no. 3, pp.301 - 313. 분석과학회지 = Journal of the Korean Society of Analytical Sciences v. 7 no. 3 301 313. x-ray photoelectron spectroscopy and rutherford backscattering spectroscopy