SUH, KW KIM, SG KIM, SY RA, JW 2024-01-21T23:10:41Z 2024-01-21T23:10:41Z 2021-08-31 1992-04 0895-2477 https://pubs.kist.re.kr/handle/201004/146456 Microwave imaging for dielectric objects under the Born approximation is suggested by using the computerized tomography based on projection. Limiting factors of degradation in reconstructed images are identified and explored in terms of projection function and necessary condition on the first-order Born approximation. To illustrate the usefulness of the presented method, simulation and experiment are performed in this article. English JOHN WILEY & SONS INC MICROWAVE IMAGING FOR DIELECTRIC OBJECTS UNDER THE BORN APPROXIMATION BASED ON PROJECTION Article 10.1002/mop.4650050415 1 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.5, no.4, pp.194 - 198 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 5 4 194 198 scie scopus A1992HJ33200014 2-s2.0-0026852326 Engineering, Electrical & Electronic Optics Engineering Optics Article MICROWAVE IMAGING COMPUTERIZED TOMOGRAPHY PROJECTION INVERSE SCATTERING CONVOLUTION BACK PROJECTION