김용 김무성 김상열 엄경숙 민석기 2024-01-22T00:05:21Z 2024-01-22T00:05:21Z 2022-01-10 1991-01 0374-4884 https://pubs.kist.re.kr/handle/201004/146919 Korean Physical Society Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry. Article 2 Journal of the Korean Physical Society, v.v. 24, pp.359 - ? Journal of the Korean Physical Society v. 24 359 ? spectroscopic ellipsometry superlattice MOCVD