LEE, JI LEE, MB LEE, YJ HAN, IK KANG, KN PARK, KO 2024-01-22T00:12:38Z 2024-01-22T00:12:38Z 2022-01-10 1990-10-11 0013-5194 https://pubs.kist.re.kr/handle/201004/147040 English IEE-INST ELEC ENG SIMPLE METHOD TO EXTRACT GATE VOLTAGE DEPENDENT SOURCE DRAIN RESISTANCE IN MOSFETS Article 10.1049/el:19901156 1 ELECTRONICS LETTERS, v.26, no.21, pp.1806 - 1807 ELECTRONICS LETTERS 26 21 1806 1807 scie scopus A1990EF10100039 2-s2.0-0025507130 Engineering, Electrical & Electronic Engineering Article Fets materials testing Semiconductor devices Semiconductor devices and materials