PARK, YJ HAN, CW SHIM, KB PARK, SC KIM, CB MIN, SK 2024-01-22T00:14:50Z 2024-01-22T00:14:50Z 2022-01-10 1990-08 0022-0248 https://pubs.kist.re.kr/handle/201004/147075 English ELSEVIER SCIENCE BV GROWTH AND CHARACTERIZATION OF GAAS-IN BY A NEW HORIZONTAL ZONE MELT TECHNIQUE Article 10.1016/0022-0248(90)90004-5 1 JOURNAL OF CRYSTAL GROWTH, v.104, no.3, pp.610 - 616 JOURNAL OF CRYSTAL GROWTH 104 3 610 616 scie scopus A1990DY29800004 2-s2.0-0025475911 Crystallography Materials Science, Multidisciplinary Physics, Applied Crystallography Materials Science Physics Article HZM DMF CCD camera GaAs hardening effect