LEE, JI LEE, MB KANG, KN PARK, KO 2024-01-22T00:15:34Z 2024-01-22T00:15:34Z 2022-01-10 1990-06-21 0013-5194 https://pubs.kist.re.kr/handle/201004/147087 English IEE-INST ELEC ENG SIMPLE EXTRACTION METHOD FOR MOBILITY PARAMETERS IN SI-MOSFETS AT 77-K Article 10.1049/el:19900558 1 ELECTRONICS LETTERS, v.26, no.13, pp.852 - 854 ELECTRONICS LETTERS 26 13 852 854 scie scopus A1990DM82200016 2-s2.0-0025446435 Engineering, Electrical & Electronic Engineering Article FETs materials materials testing Semiconductor devices Semiconductor devices