KIM, HS KIM, EK MIN, SK LEE, CC 2024-01-22T00:43:48Z 2024-01-22T00:43:48Z 2022-01-10 1989-08 0947-8396 https://pubs.kist.re.kr/handle/201004/147332 English SPRINGER VERLAG X-RAY AND DLTS CHARACTERIZATIONS OF INXGA1-X AS(X-LESS-THAN-0.03)/GAAS LAYERS GROWN BY VPE USING AN IN/GA ALLOY SOURCE Article 10.1007/BF00616292 1 APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, v.49, no.2, pp.143 - 147 APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 49 2 143 147 N scie A1989AG02500003 Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Article X-ray DLTS InGaAs/GaAs layer VPE