나종갑 Y. R. Cho Y. H. Kim T. D. Lee S. J. Park 2024-01-22T01:03:35Z 2024-01-22T01:03:35Z 2022-01-10 1989-01 https://pubs.kist.re.kr/handle/201004/147444 Effects of annealing temperature on microstructure and electrical and optical properties of radio-frequency-sputtered tin-doped indium oxid thin films. Article 3 J. Am. ceram. soc., v.v. 72, no.no. 4, pp.698 - 701 J. Am. ceram. soc. v. 72 no. 4 698 701 indium oxide sputtering electrical property optical property