김용태 김춘근 민석기 2024-01-22T01:13:00Z 2024-01-22T01:13:00Z 2022-01-10 1988-01 https://pubs.kist.re.kr/handle/201004/147599 A study on the nucleation, growth and shrinkage of oxidation induced stacking faults(OSF), part I: nucleation and thermal behavior of oxidation induced stacking faults. Article 3 J. Kor. inst. telem. elec., v.v. 25, pp.759 - 765 J. Kor. inst. telem. elec. v. 25 759 765