Lim, Sooyeon Park, Soohyung Kim, Hong-Kyu Choi, In-Chan 2024-06-28T07:30:08Z 2024-06-28T07:30:08Z 2024-06-28 2024-08 1567-1739 https://pubs.kist.re.kr/handle/201004/150138 Despite the rapid development of the state-of-the-art in-situ/operando transmission electron microscopy technologies capable of generating a substantial volume of diffraction pattern images in a compressed time frame, the associated image interpretation apparatus remains incompletely automated. Since the analysis of the acquired data is predominantly focused on a subset of this extensive data set, there is the potential for critical information to be inadvertently omitted. Using a set of computer vision algorithms, we have developed a fully automated computational tool specifically tailored for the systematic analysis of electron diffraction patterns. Our research results demonstrate that the proposed methodology represents a viable and effective approach for the automated analysis of the substantial corpus of data collected during in-situ experimental investigations. English The Korean Physical Society Fully automated analysis approach for in situ electron diffraction Article 10.1016/j.cap.2024.05.014 1 Current Applied Physics, v.64, pp.68 - 73 Current Applied Physics 64 68 73 Y scie scopus kci 001245867400001 2-s2.0-85194059645 Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Article HOUGH TRANSFORM SOFTWARE TOOL MICROSCOPE PATTERNS IMAGES ARRAY Transmission electron microscopy Selected area diffraction pattern Computer vision Automation 2D materials