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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Kyunghwan</dcvalue>
<dcvalue element="contributor" qualifier="author">Choi,&#x20;Sunhae</dcvalue>
<dcvalue element="contributor" qualifier="author">Bong,&#x20;Haekyun</dcvalue>
<dcvalue element="contributor" qualifier="author">Oh,&#x20;Jungwoo</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-11-30T06:00:25Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-11-30T06:00:25Z</dcvalue>
<dcvalue element="date" qualifier="created">2024-11-30</dcvalue>
<dcvalue element="date" qualifier="issued">2025-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">1613-6810</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;151209</dcvalue>
<dcvalue element="description" qualifier="abstract">Metal-assisted&#x20;chemical&#x20;etching&#x20;(MACE),&#x20;a&#x20;wet-based&#x20;anisotropic&#x20;etching&#x20;process&#x20;for&#x20;semiconductors,&#x20;has&#x20;emerged&#x20;as&#x20;an&#x20;alternative&#x20;to&#x20;plasma-based&#x20;etching.&#x20;However,&#x20;using&#x20;noble&#x20;metal&#x20;catalysts&#x20;in&#x20;MACE&#x20;limits&#x20;the&#x20;implementation&#x20;of&#x20;complementary&#x20;metal-oxide-semiconductor&#x20;(CMOS)&#x20;processes.&#x20;This&#x20;study&#x20;explores&#x20;Si&#x20;etching&#x20;using&#x20;an&#x20;ultrathin&#x20;Ni&#x20;catalyst&#x20;as&#x20;a&#x20;novel&#x20;approach&#x20;for&#x20;MACE.&#x20;The&#x20;thickness&#x20;of&#x20;the&#x20;Ni&#x20;catalyst&#x20;emerges&#x20;as&#x20;a&#x20;critical&#x20;parameter,&#x20;with&#x20;1&#x20;nm&#x20;of&#x20;Ni&#x20;proving&#x20;to&#x20;be&#x20;the&#x20;optimal&#x20;thickness&#x20;to&#x20;achieve&#x20;smooth&#x20;and&#x20;deep&#x20;etching.&#x20;Unlike&#x20;conventional&#x20;MACE&#x20;methods,&#x20;the&#x20;ultrathin&#x20;Ni&#x20;catalyst&#x20;enables&#x20;Si&#x20;etching&#x20;without&#x20;strong&#x20;oxidants.&#x20;Wafer-scale&#x20;Si&#x20;etching&#x20;demonstrates&#x20;the&#x20;versatility&#x20;of&#x20;the&#x20;ultrathin&#x20;Ni&#x20;catalyst&#x20;in&#x20;producing&#x20;various&#x20;microstructures.&#x20;It&#x20;is&#x20;found&#x20;that&#x20;the&#x20;ultrathin&#x20;Ni&#x2F;Si&#x20;interfacial&#x20;state&#x20;plays&#x20;a&#x20;crucial&#x20;role&#x20;in&#x20;influencing&#x20;the&#x20;Si&#x20;reactivity,&#x20;lowering&#x20;the&#x20;barrier&#x20;for&#x20;Si&#x20;oxidation.&#x20;CMOS-compatible&#x20;and&#x20;cost-efficient&#x20;ultrathin&#x20;Ni&#x20;makes&#x20;MACE&#x20;a&#x20;promising&#x20;alternative&#x20;for&#x20;semiconductor&#x20;nanofabrication.&#x20;This&#x20;study&#x20;pioneers&#x20;MACE&#x20;using&#x20;an&#x20;ultrathin&#x20;non-noble&#x20;metal&#x20;catalyst,&#x20;offering&#x20;valuable&#x20;insights&#x20;for&#x20;researchers&#x20;in&#x20;this&#x20;field.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">Wiley&#x20;-&#x20;V&#x20;C&#x20;H&#x20;Verlag&#x20;GmbbH&#x20;&amp;&#x20;Co.</dcvalue>
<dcvalue element="title" qualifier="none">Modified&#x20;Si&#x20;Oxidation&#x20;Behavior&#x20;by&#x20;Ultrathin&#x20;Ni&#x20;Catalyst&#x20;Enabling&#x20;Oxidant-Less&#x20;Metal-Assisted&#x20;Chemical&#x20;Etching</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1002&#x2F;smll.202409091</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">Small,&#x20;v.21,&#x20;no.11</dcvalue>
<dcvalue element="citation" qualifier="title">Small</dcvalue>
<dcvalue element="citation" qualifier="volume">21</dcvalue>
<dcvalue element="citation" qualifier="number">11</dcvalue>
<dcvalue element="description" qualifier="isOpenAccess">Y</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">001357385900001</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-85207969726</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Chemistry,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Chemistry,&#x20;Physical</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Nanoscience&#x20;&amp;&#x20;Nanotechnology</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Condensed&#x20;Matter</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Chemistry</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Science&#x20;&amp;&#x20;Technology&#x20;-&#x20;Other&#x20;Topics</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">HIGH-ASPECT-RATIO</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SILICON</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">NANOSTRUCTURES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">NANOWIRES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ARRAYS</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">metal-assisted&#x20;chemical&#x20;etching&#x20;(MACE)</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">nanostructure</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">silicon</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">ultrathin&#x20;nickel</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">CMOS-compatible</dcvalue>
</dublin_core>
