Kim, Sanghun Yoon, Yeomin Park, Chanhyuk Choi, Jun Woo Jang, Jeong Woo Kim, Hoyeon Kang, Hyung-Won Kim, Dong Hun 2025-09-17T02:02:46Z 2025-09-17T02:02:46Z 2025-09-16 2025-09 https://pubs.kist.re.kr/handle/201004/153172 The challenge of directly depositing highly crystalline thin films onto flexible substrates because of their low thermal stability has motivated the exploration of thin-film transfer techniques. In this study, we report on the thin-film transfer process of sputter-grown BiFeO3/CoFe2O4 bilayer thin films using a sacrificial alpha-MoO3 layer on SrTiO3(001) substrates. A significant cation diffusion into the alpha-MoO3 layer leading to the formation of secondary phases in CoFe2O4 films was effectively suppressed by lowering the deposition temperature. However, the formation of secondary phases could not be avoided in crystallized BiFeO3 thin films. The large leakage current in the BiFeO3 thin film dramatically decreased upon annealing; however, a critical temperature existed where alpha-MoO3 reacted with SrTiO3, thereby resulting in the collapse of its two-dimensional structure. The CoFe2O4 thin films not only prevented diffusion but also significantly reduced the leakage current in the BiFeO3/CoFe2O4 bilayer. Bilayer stacks transferred onto flexible substrates by rupturing the interconnection in the alpha-MoO3 layer maintained their magnetic anisotropy and exhibited improved leakage current characteristics. English American Chemical Society Magnetic and Leakage Current Characteristics of Transferred CoFe2O4/BiFeO3 Thin Films Article 10.1021/acsanm.5c02961 1 ACS Applied Nano Materials, v.8, no.36, pp.17483 - 17492 ACS Applied Nano Materials 8 36 17483 17492 N scie scopus 001560912600001 Nanoscience & Nanotechnology Materials Science, Multidisciplinary Science & Technology - Other Topics Materials Science Article DER-WAALS EPITAXY INTEGRATION thin-film transfer two-dimensional alpha-MoO3 layers BiFeO3 thin films CoFe2O4 thin films mechanical exfoliation 2-2 type nanocompositethin films