Yoon, Jaesung Lee, Seong-Hyub Kim, Minhwan Kim, Duck Ho Choe, Sug-Bong 2024-01-12T02:34:09Z 2024-01-12T02:34:09Z 2022-12-12 2022-12 0021-8979 https://pubs.kist.re.kr/handle/201004/75884 We propose an electric measurement technique for the magnetic anisotropy field of ferromagnetic thin films and their tiny patterned structures, particularly, in the case of in-plane magnetic anisotropy. This technique measures the anomalous Hall resistance by sweeping the angle or strength of the external magnetic field. The magnetic anisotropy field can be determined explicitly from the linear dependence of the Hall resistance on the angle and strength of the external magnetic field. The present technique can be applied to both ferromagnetic thin films and their patterned magnetic structures with small volumes, overcoming the signal resolution limit of conventional techniques. English American Institute of Physics Measurement technique of magnetic anisotropy field on patterned magnetic structures Article 10.1063/5.0127152 1 Journal of Applied Physics, v.132, no.22 Journal of Applied Physics 132 22 N scie scopus 000907738400016 Physics, Applied Physics Article