Nam, Yune-Seok Kim, Dae-Yun Park Yong Keun Yu, Ji-Sung Lee, Seong-Hyub Kim, Duck Ho Min, Byoung-Chul Choe, Sug-Bong 2024-01-12T03:00:47Z 2024-01-12T03:00:47Z 2022-08-23 2022-08 0003-6951 https://pubs.kist.re.kr/handle/201004/76640 Thisstudywassupporte dbytheSamsungScienceand Technology Foundation (No. SSTF-BA1802-07), the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT (MSIT) (Nos. 2015M3D1A1070465 and 2020R1A5A1016518), and Samsung Electronics Co., Ltd. D.H.K. was supported by the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (No. 2022R1A2C2004493), the POSCO Science Fellowship of the POSCO TJ Park Foundation, the National Research Council of Science and Technology (NST) grant funded by the Ministry of Science and ICT (No. 2N45290), and the Korea Institute of Science and Technology (KIST) Institutional Program (Nos. 2E31032 and 2E31541). English American Institute of Physics Exchange-stiffness measurement scheme based on domain-wall chirality transition Article 10.1063/5.0096132 1 Applied Physics Letters, v.121, no.7 Applied Physics Letters 121 7 N scie scopus 000841998500009 Physics, Applied Physics Article