Jeon, Nam Joong Seo, Jangwon Kim, Yanghee Lee, Ji Yeong Hong, Sugyeong Kim, Sun Hee Lee, Jung-Keun 2024-01-12T03:31:26Z 2024-01-12T03:31:26Z 2022-11-28 2022-04 2160-0392 https://pubs.kist.re.kr/handle/201004/76742 FAMn:PbI3 perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI3 with low (~1%) Mn concentration showed a hyperfine sextet line originated from Mn++ ions. FAMn:PbI3 with high (10%) Mn concentration showed broad resonance (~500 G peak-to-peak linewidth). However, after bombardment of FAMn:PbI3 with high Mn concentration by focused ion be ams (FIB), a sharp ESR peak appeared. The peak-to-peak linewidth (ΔHpp ) was ~8 G regardless of the temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K - 50 K), which indicates the presence of localized electrons at the defect sites at low temperatures. The g-value increased from g = 2. 0002 to 2.0016 as the temperature increased from 5 K to 50 K. Together with the ongoing search for electron spin echo (ESE), this could potentially provide a platform for realizing magnetic bits, information storage, and increased manipulation speed. English Scientific Research Pub Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films Article 10.4236/aces.2022.122007 1 ADVANCES IN CHEMICAL ENGINEERING AND SCIENCE, v.12, no.02, pp.87 - 95 ADVANCES IN CHEMICAL ENGINEERING AND SCIENCE 12 02 87 95 N other