LEE, TAEK SUNG KIM, WON MOK Seok-Joo Byun Jangkyo Lee Seok Yong Byun 2024-01-12T06:53:43Z 2024-01-12T06:53:43Z 2021-09-29 2015-05 1071-0922 https://pubs.kist.re.kr/handle/201004/80284 In this paper, we propose a precise and fast computational method for the simulation and analysis of moir？ patterns including a complex, large scale of films and a reflecting surface under illumination of an external ambient light source. This algorithm is based on convolution with superposition of the intensity profile which is transmitted from the optical layers and the point spread function. The computation time is shown to be much faster than that of the conventional ray-tracing algorithm. It was also considered of an optically equivalent system with no reflection surface layer in order to handle a non-sequential system containing a reflecting surface. English Moire techniques Computational imaging Ray-tracing An Efficient Simulation Algorithm for Analysis of Moire Patterns in Display Systems Conference 1 The Society for Information Display Technical Digests 2015, pp.1392 - 1395 The Society for Information Display Technical Digests 2015 1392 1395 US San Jose, California, USA 2015-05-21 53rd Annual SID Symposium, Seminar, and Exhibition 2015 (Display Week 2015)