Lim, Y.-A. Lee, C.G. Kim, J.-P. Ryu, J. 2024-01-12T07:23:59Z 2024-01-12T07:23:59Z 2022-03-07 2009-07 0000-0000 https://pubs.kist.re.kr/handle/201004/80947 This paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a I-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors. ？2009 IEEE. English IEEE Stable haptic interaction for AFM-based nanomanipulation Conference 10.1109/ISIE.2009.5222558 1 IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009, pp.983 - 988 IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009 983 988 US Seoul 2009-07-05 IEEE International Symposium on Industrial Electronics 2-s2.0-77950128207