Ahn, Jae Pyoung 2024-01-12T07:25:57Z 2024-01-12T07:25:57Z 2022-01-14 2008-08 https://pubs.kist.re.kr/handle/201004/81039 English ICMAP Electrical properties and microstructural characterization of single ZnO nanowire sensor manufactured by focused ion beam Conference 1 2008 International Conference on Microelectronics and Plasma Technology 2008 International Conference on Microelectronics and Plasma Technology KO Ramada Plaza Jeju Hotel Jeju Island, Jeju, Korea 2008-08-18 Electrical properties and microstructural characterization of single ZnO nanowire sensor manufacture