Hong, K.T. Ji, Y.S. Chung, S.J. Ok, M.-R. Ji, Y.H. Lee, K.S. 2024-01-12T07:56:33Z 2024-01-12T07:56:33Z 2022-03-07 2006-07 0255-5476 https://pubs.kist.re.kr/handle/201004/81598 The crystallization behavior of Cu and Zr-base Bulk Metallic Glass were investigated using the electrical resistivity measurements in isothermal annealing. Electrical resistivity evolutions exhibited one or two stage of resistivity reduction according to additional elements respectively. In order to analyze the electrical resistivity reduction, micro structure evolutions were analyzed using DSC, XRD, and TEM. English Trans Tech Publications Ltd Analysis on the phase transition behavior of bulk metallic glass by electrical resistivity measurement Conference 10.4028/0-87849-428-6.2065 1 5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006, pp.2065 - 2070 5th International Conference on Processing and Manufacturing of Advanced Materials - THERMEC'2006 2065 2070 US Vancouver 2006-07-04 Materials Science Forum 2-s2.0-38349042195