LEE, YEON HEE 2024-01-12T09:40:33Z 2024-01-12T09:40:33Z 2022-01-14 2001-11-01 https://pubs.kist.re.kr/handle/201004/83771 Sturctural characterization of various ionomers by time-of-flight secondary ion mass spectrometry Conference 1 SIMS, pp.0 SIMS 0 0 International Conference on SIMS and Related Topics - 직접입력